Figure 2: Simplified schematic of the synchrotron-based scanning X-ray fluorescence microscope. | Scientific Reports

Figure 2: Simplified schematic of the synchrotron-based scanning X-ray fluorescence microscope.

From: A Hidden Portrait by Edgar Degas

Figure 2

A monochromatic undulator-based X-ray source is focused by Kirkpatrick-Baez mirrors. The focused beam passes through an aperture in the Maia detector onto the raster-scanned sample. The X-ray photon events are detected in a backscatter geometry and analysed to produce elemental and scatter maps. (Edgar Degas, French, 1834–1917, Portrait of a Woman (Portrait de Femme), c. 1876–80, oil on canvas, 46.3 × 38.2 cm, National Gallery of Victoria, Melbourne, Felton Bequest, 1937).

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