Figure 2: Projection of the 3D reciprocal space maps of the NixMg1−xO 200 reflection along the reciprocal lattice vector Qx of NixMg1−xO thin films (x = 1, 0.83, 0.64) grown on MgO(100) substrates recorded with 6 keV (2.067 Å) synchrotron radiation.

The intensity of the diffraction peaks is given by an iso-intensity contour map on a logarithmic scale. The dashed lines give the local intensity maxima of the NixMg1−xO 200 and MgO 200 diffraction peaks as indicated.