Figure 2

Surface FESEM images of the ITO146/4nm films (a) before and (b) after rapid thermal annealing at 600 °C for 10 min. The as deposited sample showed agglomerated Ag islands on the surface of a-ITO matrix, while the annealed sample showed a crystallized ITO film with several nano-sized Ag islands and craters on the c-ITO surface.