Figure 1 | Scientific Reports

Figure 1

From: The Effect of Preparation Conditions on Raman and Photoluminescence of Monolayer WS2

Figure 1

Characterization of monolayer WS2 synthesized on Si/SiO2.

(a) Optical microscope images display randomly oriented equilateral triangular growth. (b) The AFM image is obtained on a representative WS2 triangle. A height profile (inset) is measured along the dashed line and shows a step height of ~0.8 nm. (c) Raman spectroscopy and (d) photoluminescence measurements confirm monolayer WS2.

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