Figure 1

Diffuse reflectance of apple samples vs spatial frequency of illumination for measured surface #2 at 460, 527 and 630 nm recorded by the SFDI system.
NTM indicates the apple samples nearer to mean values of the diffuse reflectance.

Diffuse reflectance of apple samples vs spatial frequency of illumination for measured surface #2 at 460, 527 and 630 nm recorded by the SFDI system.
NTM indicates the apple samples nearer to mean values of the diffuse reflectance.