Figure 6
(a) Comparison of the normalized PL and IOT spectra performed at low and high T for the thin rubrene film deposited with Tsub = 103 °C. (b) Comparison of the PL spectra performed at 15 and 300 K on the rubrene films fabricated with Tsub = 103, 154 and 198 °C, respectively. (c) Schematic diagrams illustrating the origins of all the PL peaks performed at 15 K for the rubrene films fabricated with Tsub = 103 °C (which was composed of twisted rubrene), 154 °C (composed of both twisted and planar rubrene together with formation of band characteristics) and 198 °C (composed of planar rubrene with formation of band characteristics), respectively. FE: Frenkel exciton recombination and VS: vibrational state.
