Figure 7 | Scientific Reports

Figure 7

From: High Photoresponsivity Ge-dot PhotoMOSFETs for Low-power Monolithically-Integrated Si Optical Interconnects

Figure 7

Size-dependent normalized photoresponsivity per unit Ge volume and internal quantum efficiency (IQE) for Ge-dot p-PTs with tox = 3.5 nm measured under (a) PIN = 6 nW and (b) PIN = 87.5 μW. Decreasing the Ge-dot diameter from 90 nm to 50 nm significantly enhances the normalized photoresponsivity and IQE possibly due to an improvement in crystallinity quality with reduced defect densities.

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