Advanced search

Filter By:

Journal Check one or more journals to show results from those journals only.

Choose more journals

Article type Check one or more article types to show results from those article types only.
Subject Check one or more subjects to show results from those subjects only.
Date Choose a date option to show results from those dates only.

Custom date range

Clear all filters
Sort by:
Showing 1–6 of 6 results
Advanced filters: Author: Alexander L. Shluger Clear advanced filters

  • Atomic force microscopy is used to measure reorganization energies upon charging individual molecules adsorbed on insulators.

    • Alexander L. Shluger
    • Peter Grutter
    News & Views
    Nature Nanotechnology
    Volume: 13, P: 360-361

  • The trapping of electrons by grain boundaries in semiconducting and insulating materials is important for a wide range of devices such as sensors, and solar and fuel cells. First-principles calculations on MgO, LiF and NaCl reveal a novel type of electron trapping at grain boundaries associated with the negative electron affinity of these materials.

    • Keith P. McKenna
    • Alexander L. Shluger
    Research
    Nature Materials
    Volume: 7, P: 859-862

  • The oxidation state of hydride ions in oxide hosts is a matter of debate. Here, the authors address this question with a range of techniques and suggest that the electron density near an incorporated hydride ion is less than that at the hydrogen in a hydroxide ion, contrary to formal valence arguments.

    • Katsuro Hayashi
    • Peter V. Sushko
    • Hideo Hosono
    ResearchOpen Access
    Nature Communications
    Volume: 5, P: 1-8

  • Dielectric breakdown is a major reliability issue in electronic devices. This Review discusses the data and knowledge accumulated from experimental and theoretical studies of dielectric breakdown in different insulating materials, with a focus on phenomenological models and novel computational approaches.

    • Andrea Padovani
    • Paolo La Torraca
    • Alexander L. Shluger
    Reviews
    Nature Reviews Materials
    Volume: 9, P: 607-627