The nanoscale structures of graft-type PEMs, prepared by radiation-induced graft polymerization of styrene onto poly(ethylene-co-tetrafluoroethylene) (ETFE) films followed by sulfonation, were investigated using a small-angle neutron scattering (SANS) technique. The SANS profiles of the grafted films showed shoulder peaks at a d-spacing of ∼30 nm, which were attributed to the polystyrene grafts introduced into the amorphous phases between the ETFE lamellar crystals. In the ETFE PEMs, this d-spacing increased to 34 nm because the graft regions were enlarged by the volume of the attached sulfonic acid groups.
- Shin-ichi Sawada
- Daisuke Yamaguchi
- Yasunari Maekawa
