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Advanced filters: Author: Andreas Apseros Clear advanced filters

X-ray linear dichroic tomography of crystallographic and topological defects

A new non-destructive spectroscopic method, ptychographic X-ray linear dichroic orientation tomography, is described, allowing the intragranular and intergranular characterization of extended polycrystalline and non-crystalline materials in three dimensions with nanoscale spatial resolution.

Andreas Apseros
Valerio Scagnoli
Johannes Ihli
ResearchOpen Access11 Dec 2024
Nature

Volume: 636, P: 354-360
Investigating skyrmion stability and core polarity reversal in NdMn₂Ge₂

Samuel K. Treves
Victor Ukleev
Valerio Scagnoli
ResearchOpen Access02 Jan 2025
Scientific Reports

Volume: 15, P: 1-10
Determination of sub-ps lattice dynamics in FeRh thin films

Michael Grimes
Hiroki Ueda
Valerio Scagnoli
ResearchOpen Access20 May 2022
Scientific Reports

Volume: 12, P: 1-11