A reflective spatial light modulator for extreme ultraviolet (EUV) or soft X-ray light is demonstrated in an electronic Wigner crystal material with a sub-90-nm feature size. The diffraction grating imprinted by sub-picosecond EUV beams is rewritable. The projected efficiency according to the modelling exceeds 1%.
- Igor Vaskivskyi
- Anze Mraz
- Dragan Mihailovic
