The behaviour of Tungsten ditelluride (WTe2) in few-layer form is not yet fully characterized. Here the authors use a near-field terahertz microscopy technique to observe the electromagnetic responses of WTe2 flakes from one to several layers and to study their semimetallic/ semiconducting behavior.
- Ran Jing
- Yinming Shao
- D. N. Basov
