Advanced search

Filter By:

Journal Check one or more journals to show results from those journals only.

Choose more journals

Article type Check one or more article types to show results from those article types only.
Subject Check one or more subjects to show results from those subjects only.
Date Choose a date option to show results from those dates only.

Custom date range

Clear all filters
Sort by:
Showing 1–1 of 1 results
Advanced filters: Author: Niklas Hellgren Clear advanced filters

  • X-ray photoelectron spectroscopy (XPS) can be used to investigate chemical bonding and elemental composition. This Primer discusses how XPS can be used to characterize thin films, including key considerations for sample preparation, experimental set-up and data analysis.

    • Grzegorz Greczynski
    • Richard T. Haasch
    • Lars Hultman
    Reviews
    Nature Reviews Methods Primers
    Volume: 3, P: 1-19