Grazing incidence small-angle neutron scattering (GISANS) allows for the investigation of nanostructures in thin films and at surfaces due to the use of a reflection geometry. Possibilities and challenges of GISANS are reviewed with several different examples of thin nanostructured polymer films. With GISANS buried lateral structures can be probed destruction free using the variable-probed depth as function of the incidence angle. By this, averaged statistical information is detected over the large illuminated sample surface.