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Showing 1–2 of 2 results
Advanced filters: Author: Tijn van Omme Clear advanced filters

  • Two-dimensional transition metal carbides and nitrides (MXenes) have emerged as highly conductive and stable materials, of promise for electronic applications. Here, the authors use in situ electric biasing and transmission electron microscopy to investigate the effect of surface termination and intercalation on electronic properties.

    • James L. Hart
    • Kanit Hantanasirisakul
    • Mitra L. Taheri
    ResearchOpen Access
    Nature Communications
    Volume: 10, P: 1-10

  • Oscar Recalde-Benitez and colleagues report a FIB-based sample preparation process to limit current leakage during operando TEM experiments, thus improving the accuracy of device nanocharacterization under operating conditions. The methodology results in leakage currents that are small compared to device currents, which enables the analysis of operating stack devices inside the microscope.

    • Oscar Recalde-Benitez
    • Tianshu Jiang
    • Leopoldo Molina-Luna
    ResearchOpen Access
    Communications Engineering
    Volume: 2, P: 1-8