Coherent X-ray diffraction spectroscopy has recently emerged as a powerful tool for imaging strain at the nanoscale. Developments in both fabrication and experimental techniques have now enabled all nine components of the strain tensor in a nanorod to be determined, demonstrating the ability of coherent X-ray diffraction spectroscopy to yield measurements of strain in three dimensions with a resolution of a few tens of nanometres.
- Marcus C. Newton
- Steven J. Leake
- Ian K. Robinson