Figure 3: Temperature evolution of the electronic supermodulation.
(a) Diffracted intensity of a line cut along H measured at resonance (930.85 eV) on sample #1 at selected temperatures at fixed L=1.38 and K=0. (b) Temperature dependence of the peak intensity (normalized to the maximum value) in a. Red (green) dashed line marks Tc (Tm) determined from the resistivity (magnetization) measurement shown in the insets. (c,d) Results of sample #2. The diffracted intensity in a and c share the same scale as before. (a,c) Inset: schematics of the heterostructure for samples #1 and #2, respectively. Error bars reflect the uncertainty due to mean-square deviation in determining the diffraction peak intensity based on curve fitting. r.l.u., reciprocal lattice units.
