Figure 4: Analysis and spatial variation of the strain loop shape.
From: Rapid mapping of polarization switching through complete information acquisition
(a) Derivation of metrics from the mean strain loop. Table 1 lists the abbreviations and description of all metrics. Spatial maps of (b) forward coercive bias, V+, (c) reverse coercive bias, V−, (d) area within right wing, AR, (e) area within left wing, AL, and (f) cross-over bias, VX. The black outline in the spatial maps indicates the edges of the nanocapacitors.
