Figure 2: Transmission electron microscopy (TEM) images and X-ray diffraction pattern of decahedral Ag nanoparticles.
From: Ambient-stable tetragonal phase in silver nanostructures
(a) TEM image of nanoparticles randomly assembled on a TEM grid. (b) High-resolution TEM image taken from the centre of an individual nanoparticle by aligning the electron beam parallel to the common axis of the five subunits of the nanoparticle. The red lines highlight the existence of five twin planes that cross along the common axis. Crystalline defects highlighted in the circle can be observed in this image, although the number of defects is less than that of the Ag nanowires shown in Fig. 3f. (c) High-resolution X-ray diffraction pattern obtained from dried nanoparticles at room temperature with the use of an X-ray beam having a wavelength of 0.42460 Å. The peaks are indexed according to a face-centred tetragonal (f.c.t.) phase of Ag. The scale bars in a and b represent 50 and 2 nm, respectively. a.u., arbitrary unit.
