Figure 4: Comparing measured and reconstructed diffraction intensities.

The average intensity per detector pixel as a function of scattering vector q for the TCMP object (a) and the URA reference (b). The measured diffraction patterns are compared with the diffraction patterns modelled from the ILRUFT and RAAR reconstructions. The vertical black line indicates a full-period resolution of 350 nm (175 nm half-period resolution). The plot for the CXS object is very similar to that for the TCMP object and has been omitted.