Fig. 5: Atomic-level microscopic analysis of the two samples. Sample1. | Light: Science & Applications

Fig. 5: Atomic-level microscopic analysis of the two samples. Sample1.

From: Over 1.65 GW cm−2 sr−1 brightness 590 nm yellow second-harmonic generation in MOCVD-grown high-strain InGaAs/GaAs quantum well VECSEL

Fig. 5: Atomic-level microscopic analysis of the two samples. Sample1.

a Electron Diffraction Pattern; b, c HAADF image; d The atomic intensity distribution on the cross-section of the quantum well; Sample2: e Electron Diffraction Pattern; f, g HAADF image; h The atomic intensity distribution on the cross-section of the quantum well; i, j XRD diffraction and their peak position FWHM of three full-structure wafers from the same furnace batch

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