Fig. 6: Test system with temperature interference, and response characteristics of SAW devices to temperature and ultraviolet. | Microsystems & Nanoengineering

Fig. 6: Test system with temperature interference, and response characteristics of SAW devices to temperature and ultraviolet.

From: A new strategy to minimize humidity influences on acoustic wave ultraviolet sensors using ZnO nanowires wrapped with hydrophobic silica nanoparticles

Fig. 6: Test system with temperature interference, and response characteristics of SAW devices to temperature and ultraviolet.

a Photo of the SAW UV test device with temperature interference. b Variations in the interference temperature applied to the SAW UV sensor over time. c–e Changes in SAW frequency, insertion loss and phase under interference of temperature and UV treatment. f Relationship between frequency and time for the SAW UV sensor under temperature interference before and after algorithm processing

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