Fig. 6: Long-term stability and reliability measurements of the MoS2 NEMS resonator Device 5-3 shown in Fig. 1a, with a diameter of 3 μm. | Microsystems & Nanoengineering

Fig. 6: Long-term stability and reliability measurements of the MoS2 NEMS resonator Device 5-3 shown in Fig. 1a, with a diameter of 3 μm.

From: Unveiling the tradeoff between device scale and surface nonidealities for an optimized quality factor at room temperature in 2D MoS2 nanomechanical resonators

Fig. 6

a Summary of all the measured resonance curves for 2500 min at VGS = 15 V and vRF = 50 mV, showing high stability and repeatability over time. The red dashed line is the fitting to the average curve, with an extracted Q factor of 231 ± 5. b Color map of resonances in (a) varying with time, showing a very stable resonance frequency of ~32.52 MHz (black dashed line), with the amplitude shown in color scale. Extracted (c) resonance frequency and amplitude and (d) Q factor varying with time for resonances within (a)

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