Fig. 9: C-AFM and SKPM mappings on the bare 12-nm PZT film. | NPG Asia Materials

Fig. 9: C-AFM and SKPM mappings on the bare 12-nm PZT film.

From: Thinning ferroelectric films for high-efficiency photovoltaics based on the Schottky barrier effect

Fig. 9: C-AFM and SKPM mappings on the bare 12-nm PZT film.

a Short-circuit current map generated by C-AFM under UV illumination. b Current profile along the section line indicated in panel a. The black solid line is drawn for better visualization. c Surface potential map generated by SKPM after UV illumination for 1 minute. d Surface potential profiles along the section lines indicated in panel a and Fig. S6 in Supplementary Information. In panels a and c, the middle 2 × 1 and 3 × 3 μm2 regions, respectively, were written with +6 V beforehand

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