Fig. 5
In situ analysis of drying process. The optical images of the drying of a solution of 2008P semiconducting polymer in DCB under a PDMS template at 2 min (a) and 10 min (b) from sample loading. The black arrow indicates liquid splitting in the grooves of the template, and the red arrow in the inset of a indicates a liquid boundary (partially marked by the dotted line) under a template ridge. The two horizontal lines in the inset of a indicate the PVP spacer used when 2008P lines were created with the spacer-applied configuration. c Optical image showing the de-pinning of the contact line when groove pinning is lost. The white arrow indicates the original contact line between the silicon substrate and 2008P solution bridges. The horizontal lines are the PVP spacers for the patterning of 2008P. The inset of c shows air fronts moving in the grooves during drying in the spacer-applied configuration
