Fig. 2
Energy dispersive spectroscopy (EDS) characterization of fabricated metal nanosctructures. a SEM images of supported 20 μm tetrakaidekahedron unit cell on a Si chip before pyrolysis and b the same structure after pyrolysis (4 μm width). c SEM image of the structure showing where EDS data was collected. d EDS spectrum taken from an internal beam region reveals chemical composition to be more than 90 wt% nickel. e–h EDS maps show high uniformity of the atomic composition throughout the structure. Scale bars are 5 μm for a, 1 μm for b and 2 μm for c, e–h
