Fig. 4
RP complexes that do not reach the FS FRET level alternate between US and PS FRET levels for long period of time. a Typical EFRET trace where the RP alternates between unscrunched (US) and partly scrunched (PS) DNA promoter FRET levels. The red solid line represents the FRET levels extracted from empirical Bayesian probability hidden Markov model. We collect the dwell times Δt for each FRET level. Experimental condition: WT DNA promoter; NTP start: ApA; NTP: U/G/ATP 80 µM. b, c Probability density distribution of the dwell times ΔtUS and ΔtPS, respectively, for the experimental conditions described in a, with its single and double exponential MLE fit (dashed and solid line, respectively, Methods for MLE fit procedure). d Average for all the NTP concentration (Supplementary Fig. 2e-g) of the double exponential MLE parameters (k1 and k2 exit rates, and P probability of being in the exponential with k1 exit rate) for US and PS FRET states averaged over all NTP concentrations, for the conditions described in Fig. 2a and Supplementary Table 1. Color scheme as in Fig. 2
