Fig. 4
Current-density- and electric-field-decompositions in VO2. a Experimentally measured im–vm plot from a lateral VO2 thin film with electrodes separated by 16 µm. b Schematic of the device structure. c–e Temperature (T) maps of the VO2 film with applied voltages (from a voltage source), along with the measured currents noted. f–h Temperature maps of the same device with applied currents (from a current source), along with the measured voltages noted. c–h were measured on a device that was different from but identical in geometry and composition to the one that produced data in a. Common scale bar in f is 16 µm. Additional analysis shown in Supplementary Figs 9–10
