Fig. 6

Thickness and absorbance normalized circular dichroic properties of ProSQ-C16 thin films. a Averaged maximum values of thickness normalized CD for varying annealing temperatures of (R,R)- and (S,S)-ProSQ-C16 thin films. The error bars are standard deviations. b Collection of thickness normalized CD spectra for thin films of varying thicknesses annealed at 180 °C. The layer thickness is color-coded as stated in the legend. c Unpolarized absorbance Abs^meas vs. layer thickness. Data are peak values at around 780 nm from samples annealed at 180 °C. The unpolarized absorbance is valid for both enantiomers. From the linear fit of Abs according to Eq. (7) the reflection corrected absorbance Abs^cor is calculated. d Maximum apparent and true dissymmetry factors g_ap and g_true according to Eqs. (6) and (8), respectively, at 780 nm against layer thickness for samples annealed at 180 °C. Straight lines in c and d are linear fits to the data points. Data in b and d are from the same samples and thus are convertible. Error bars are inferred from the experimental uncertainties of the measurements and are not standard deviations