Fig. 2

Diffraction pattern from HEWL. Diffraction pattern from a single HEWL microcrystal measured using MHz pulses of 50 fs duration X-rays at 9.3 keV using the AGIPD 1M detector in the SPB/SFX instrument. Dynamic gain switching of the AGIPD detector enables simultaneous low noise and high dynamic range: each pixel has three gain settings which are automatically selected depending on the per-pixel cumulative intensity to simultaneously maximize sensitivity and dynamic range. Image clipped at 2600 counts to show content, full dynamic range of brightest spots extends to 109,000 counts