Fig. 2

Electrical detection of 180° reversal of the Néel order in CuMnAs. a Scanning electron micrograph of the cross-bar device with contacts allowing to measure longitudinal and transverse resistances along x and y axes. The added schematics correspond to the measurement set-up for the simultaneous detection of the transverse second-harmonics signal \(R_{xy}^{2\omega }\) and the longitudinal first-harmonics signal \(R_{xx}^{1\omega }\). The scale bar length corresponds to 10 μm. b Schematics of measurement set-up with an alternating probing current J_ac along x axis and second-harmonic voltage detected along y axis, giving \(R_{xy}^{2\omega }\). Double-arrows illustrate a microscopic mechanism in which J_ac generates alternating deflections of the antiferromagnetic moments. c 20 ms long pulses of the writing current J_p = 11 mA (\(j_{\mathrm{p}}\sim 10^7\) A cm⁻² in CuMnAs) along the ±y direction (red/yellow arrows) are applied to set the Néel vector along the ±x axis. Second-harmonic transverse resistance \(R_{xy}^{2\omega }\) is measured with a probing current J_ac = 2 mA (\(j_{{\mathrm{ac}}}\sim 10^6\) A cm⁻²) applied along the x axis. d Same as c for one writing pulse along +y axis and one subsequent pulse along −y axis and 25 h measurement of the stability of the second-harmonic probing signal