Fig. 6
From: Frequency-dependent decoupling of domain-wall motion and lattice strain in bismuth ferrite
Schematic of the in situ XRD experimental setup. Samples were placed in the sample chamber and were bathed in silicon oil. The 2D image is obtained by a Dectris Pilatus3 X CdTe detector (see Methods) and the diffraction pattern is radially integrated from a wedge of the 2D diffraction image
