Fig. 1 | Nature Communications

Fig. 1

From: Electrochromic semiconductors as colorimetric SERS substrates with high reproducibility and renewability

Fig. 1

Composition control of tungsten oxide through Al intercalation. a Top-view and b cross-sectional scanning electron microscopy (SEM) images for the pristine tungsten oxide film on fluorine-doped tin oxide (FTO) glass. c SEM image of the Al-intercalated tungsten oxide film, and the elemental mapping results of the selected area. d Cyclic voltammogram (CV) profiles of the tungsten oxide film for 50 cycles, obtained in 1 M AlCl3 aqueous analyte at a scan rate of 10 mV/s. The 50 curves are overlapping, suggesting good reversibility. e Absorbance switching monitored at 532 nm for tungsten oxide, with alternating biases switching between −0.5 and 0.2 V in 1 M AlCl3 aqueous analyte. f Absorbance spectra taken for tungsten oxide films from five batches, and those after discharging potentiostatically at −0.5 V for 180 s in 1 M AlCl3 aqueous analyte. g Ratio of W5+/W6+ calculated from deconvolution of X-ray photoelectron spectroscopy (XPS) W 4f core-level spectra for Al-intercalated film in five batches

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