Table 1 Summary of the results of the TLM measurements performed on top-contact and bottom-contact DPh-DNTT TFTs fabricated on flexible PEN substrates
Device architecture | RCW (Ωcm) at VGS−Vth = −2.5 V | LT (µm) at VGS−Vth = −2.5 V | µ0 (cm2 V−1 s−1) | L1/2 (µm) |
|---|---|---|---|---|
TC | 56 ± 14 | 2.4 ± 0.6 | 5.7 ± 0.1 | 4.3 ± 0.2 |
BC | 29 ± 13 | 1.1 ± 0.5 | 4.9 ± 0.1 | 2.6 ± 0.2 |