Fig. 2
From: Lattice strain-enhanced exsolution of nanoparticles in thin films
Characteristics of the exsolution in thin films. a Effects of the substrate on three important physical parameters related to the exsolved thin films. b Ni 3p, Ti 3s XPS of pristine and reduced LSNT films grown on LSAT substrates. c Ex-situ cross-sectional STEM-HAADF image and d corresponding Ni EDS map of the reduced film on LSAT substrate. The reduction was performed at 550 °C for 80 h in pure H2. Scale bars, 10 nm. e Cross-sectional bright-field STEM image of a Ni particle exsolved on (100) perovskite surface after reducing at 900 °C for 12 h in pure H2. Scale bar, 5 nm. f Magnified STEM image at the metal-perovskite interface, where turquoise circles denote La or Sr ions and orange circles denote Ni or Ti ions in the perovskite lattice, and yellow circles denote Ni ions in exsolved particles. Scale bar, 1 nm
