Fig. 2
From: Mosaic pattern formation in exfoliated graphene by mechanical deformation
Lateral wrinkling in supported bilayer and monolayer graphenes subjected to uniaxial loading. a, d AFM images for the graphene flakes at different strain levels. The scale bar is 1 micron and the double arrow represents the direction of the applied tension. b, e Height profiles representing the topography of the flakes for various levels of tensile strain at the cross-section line indicated in AFM image. The observed fluctuations of about ~0.5 nm between large wrinkles at all other strain levels correspond to surface roughness of polymer substrate. c, f Statistical analysis of the height and the FWHM of the lateral wrinkles at different strain levels
