Fig. 5
From: Measurement of carrier lifetime in micron-scaled materials using resonant microwave circuits
Transient decay curves. a Temperature-dependent micro-scale time-resolved microwave resonator response (μ-TRMRR) signal from InAsSb pixel (35.5 pJ pulse energy on pixel, 2000 averages on oscilloscope). Extracted lifetimes are shown above each curve. b Time-resolved photoluminescence (TRPL) response of pixel array with 68 nJ laser pulse energy (16.6 nJ incident on pixels) and c µ-TRMRR data for a single pixel with 68 pJ pulse energy (35.5 fJ incident on pixel). Both experiments in b and c are performed at 300 K, with 2000 averages on the oscilloscope. We see that a comparable response is obtained from the μ-TRMRR with >105 less energy than is needed for TRPL
