Fig. 1 | Nature Communications

Fig. 1

From: Distinguishing the sources of silica nanoparticles by dual isotopic fingerprinting and machine learning

Fig. 1The alternative text for this image may have been generated using AI.

Characterization of SiO2 NPs of different origins. a Typical SEM image of a SiO2 NP standard. b, c Typical SEM (b) and TEM (c) images of engineered SiO2 NPs. d SEM image of natural quartz particles. e, f SEM images of intact (e) and fragmentary (f) diatomite particles. g, XRD patterns of engineered and natural SiO2 NPs. h EDX patterns of engineered and natural SiO2 NPs. i The atomic ratio of O to Si (RO/Si) of engineered and natural SiO2 NPs based on the EDX measurements. The error bars represent 2s.d. (n = 4-15). EP, EF, ES, ND, and NQ represent precipitated silica, fumed silica, sol–gel silica, diatomite, and quartz, respectively

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