Fig. 2
From: Coherent diffractive imaging of microtubules using an X-ray laser
X-ray diffraction images and class averages. a X-ray diffraction image recorded from exposure of microtubule samples to a single XFEL pulse. The inner yellow circle indicates 4 nm resolution and the outer circle indicates 2 nm resolution. This scale applies to all panels. b Average of approximately 200 images selected by class average sorting of the X-ray diffraction patterns using software originally developed for electron microscopy applications36. c Sum of the class averages (13,511 images summed in total) after aligning each class average by rotating about the beam center. d Fitted diffraction image recovered by fitting Gaussian peaks to the features identified as diffraction peaks in (c)
