Fig. 3 | Nature Communications

Fig. 3

From: Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces

Fig. 3

Autocorrelations during steady-state deposition. a Growth at 144 °C as a function of Q||, with fixed Qz = 0.045 Å−1. Note that the oscillation frequency is independent of Q||. The  step spacing can be  estimated from 2π/Qmax, where Qmax is the in-plane component of the wave-vector transfer at which g(2) has the maximum oscillation amplitude. b Growth at 216 °C for two different Q||. The shape of the autocorrelation curve changes at large Q||, where the maxima become sharp and the minima become broadened. A half-monolayer correlation is observed, which is indicated by dashed lines. An empirical model to fit the data is described in the main text. Note that the upper curve in b is offset by 0.01 for the sake of clarity

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