Fig. 4
Post-deposition characterization of a C60 thin film. a AFM image of the surface of a thin film growth in two layers with a sample temperature of 196 and 216 °C for the first and second layers respectively. The total film thickness is 198 nm. The inset shows a portion of the image plotted in amplitude mode, which makes the molecular terraces more visible. b X-ray diffraction characterization of the same sample. The main plot shows a θ − 2θ scan through the (111) and (222) reflections. The insets show θ-rocking scans through each reflection
