Fig. 7

Scaling analysis of correlations and intensities. a Analysis of intensity data for a C₆₀ thin film deposited at 144 °C to extract the exponent γ. Q_corr is the value of Q_|| where the intensity breaks away from a power law dependence. b Correlation relaxation rates at different growth temperatures derived from g⁽²⁾(Q_||, Δt) curves during steady-state growth. The curves are scaled by the growth velocity v_gr in order to take into account differences in the deposition rates for different films. The dynamic exponent z changes abruptly between the low-temperature and high-temperature regimes