Fig. 2
From: Layer-by-layer self-assembly of pillared two-dimensional multilayers
Characterization of (MXene/TAEA)n multilayers. a Zeta potential of Ti3C2Tx MXene colloidal solution and charge density of TAEA solution as a function of pH. b The average thickness of (MXene/TAEA)n measured from SEM cross-section images vs. bilayer number n. The inset b is the corresponding cross-sectional SEM images of (MXene/TAEA)n on silicon wafers. c The mass loading of (MXene/TAEA)n onto PET sheets and nonwoven fibers vs. n. d Sheet resistance and electric conductivity of (MXene/TAEA)n on silicon wafers vs. n. The data in a–e show statistical values from 6 measurements in each data point. e XRD patterns of (MXene/TAEA)n vs. n, and pure MXene Ti3C2Tx film. f Digital photographs of the (MXene/TAEA)n on silicon wafers, PET sheets and glass slides vs. n. The color change on Si wafers is owing to different optical characteristics of various thickness of (MXene/TAEA)n
