Fig. 3
From: Strain-gradient mediated local conduction in strained bismuth ferrite films
Strain and strain gradient characterization. a High-resolution STEM cross section image of strained BiFeO3/LaAlO3 thin film for the GPA analysis. Scale bar 10 nm. b In-plane strain (εxx) and c out-of-plane strain (εyy) field. Here, x and y directions are parallel to the LaAlO3 [100]pc and [001]pc directions, respectively. d Strain and e strain gradient distribution along the direction perpendicular to the phase boundaries marked by red arrow in (b). f Schematic showing the strain gradients at the morphotropic phase boundaries. PB: phase boundary, STEM: scanning transmission electron microscopy
