Fig. 2

X-ray absorption edge profiles: SR-μ-XANES fluorescence intensity plots derived from two of the U composition particles contained within the sub-mm Si-based particle, alongside that of a comparison reference UO2 spectra, from44

X-ray absorption edge profiles: SR-μ-XANES fluorescence intensity plots derived from two of the U composition particles contained within the sub-mm Si-based particle, alongside that of a comparison reference UO2 spectra, from44