Fig. 3
SIMS depth-profile compositional mapping: compositional mapping results (238U and 137Cs) overlain onto the trench produced following SIMS depth-profiling into FIB-cut face. Scale bar = 10 μm
Fig. 3 | Nature Communications
SIMS depth-profile compositional mapping: compositional mapping results (238U and 137Cs) overlain onto the trench produced following SIMS depth-profiling into FIB-cut face. Scale bar = 10 μm
