Fig. 2

Stroboscopic Scanning X-ray Diffraction Microscopy (s-SXDM) measurements made on a Gaussian SAW. a With the wave propagation direction aligned orthogonal to the x–z scattering plane. b The scanning X-ray Bragg diffraction measurements are registered relative to the patterned IDT using fluorescence from the Ti adhesion layer of the Al electrodes. The device background image is a dark field optical micrograph. c The far-field X-ray diffraction pattern is sensitive to the local curvature (tilt) of the lattice planes calculated as the gradient of the displacement in two ordinal components. The oscillatory transverse and longitudinal shifts of the X-ray diffraction pattern oscillation are independently detected as peak-to-peak displacements in the centroid position spot relative to the X-ray scattering plane. d, e The expected depth dependence of an ideal Gaussian surface acoustic wave displacement (u_z) along the transverse x (d) and longitudinal y (e) directions at the dashed red lines in c. The transverse (longitudinal) curvature maxima, signified with magenta (green) dots, correlate with the double (single) lobed periodic features, respectively, experimentally observed in c. The calculated displacements correspond to the experimentally observed curvature amplitude