Fig. 1

Short-term plasticity at DA release sites is region-specific and only weakly release-dependent. a, b Mean profiles of [DA]o transients elicited by single or paired electrical pulses (arrows) at IPI of 10–200 ms in CPu (a, n = 4) and NAc (b, n = 3). Dotted traces, [DA]o attributable to the second pulse, P2, in a pair ((P1 + P2) – P1). Inset, representative voltammogram for evoked DA release. c Mean P2/P1 vs IPIs in CPu (filled circles) and NAc (open circles). Where error bars are not visible they fall within the bounds of the symbol. d P2/P1 vs peak 1p-evoked [DA]o for IPIs of 10 ms (left), 40 ms (centre) and 100 ms (right). Each data point is 1 site in CPu (filled circles, n = 35) or NAc (open circles, n = 19). Linear fits to data show P-values (F-test) to indicate whether the slope is significantly > 0. e, f (Left) Mean profiles of [DA]o transients in CPu (e, n = 5) and NAc (f, n = 6) in control conditions vs L741,626 (1 µM, green). (Right) Mean P2/P1 vs IPIs in control conditions and L741,626 in CPu (e) or NAc (f). Two-way ANOVA with Bonferroni’s test for post hoc comparisons: *P < 0.05, **P < 0.01. Error bars are ± SEM. Source data are provided as a Source Data file