Fig. 1
From: Disorder compensation controls doping efficiency in organic semiconductors

Computed density of states (DOS) in doped organic semiconductors. a DOS of doped organic semiconductors with zero intrinsic disorder on a logarithmic scale for three dopant molar ratios (DMR) (DMR = {10−3, 10−2, 1.5 × 10−1}). Relevant part of the DOS comprises energy distributions of the highest occupied and lowest unoccupied host orbitals, HOMO and LUMO+, respectively. HOMO(0) and |VC| is the mean HOMO of the corresponding undoped material, and the Coulomb interaction energy between the host cation and dopant anion at a distance a with a being the lattice constant. Feature “a” (“b”) in the top panel corresponds to neutral host molecules at a distance of a to host cations (dopant anions) and \(a/\sqrt 2\) to dopant anions (host cations). Features “c” and “d” correspond to host cations at distances of \(a/\sqrt 3\) and \(a/\sqrt 2\) to dopant anions, respectively. At low and moderate DMR (top and middle panels), novel LUMO+ distribution appears approximately at HOMO(0) + |VC|. b The same as a in a linear scale. Note the broadening of HOMO/LUMO+ distributions upon doping. c The same as b for high (σint = 0.2 eV) intrinsic disorder. In this case the mean LUMO+ is separated from HOMO(0) by the energy significantly larger than |VC| (cf. top panels of a and c) due to intrinsic disorder. The Fermi level position (denoted by EF) determined from the DOS is always the crossing point of HOMO and LUMO+ distributions so that the density of states at EF is low. The LUMO+ distribution in panels b and c has been multiplied by a factor of 100, 10, 1 from top to bottom to enhance visibility at low doping molar rates. The density of states in all panels is normalized so that the maximum DOS value is equal to 1