Fig. 4: Resistance investigation at evaluated temperatures of Mn5Si3@SiO2 nanocables.
From: Millimeters long super flexible Mn5Si3@SiO2 electrical nanocables applicable in harsh environments
a The real device with 250 um channel length for experiment. b The electrode region after FIB radiation with Mn5Si3 core naked. c After Pt/C deposition and connection to Au patterns. d The I–V curve acquired. e The recorded resistances as the temperature switching between 317 °C and 26 °C. f The resistance-temperature dependence at a range of 26-317 °C. g The I–V curve of another device used for long-time stability investigation at ~300 °C. h The I–V curve of the device incorporating a red LED light. The insets show the illustration of the nanowire connection. i The optical picture of the circuit (upper) and thermal imaging of the device substrate (bottom). j the long-time stability investigation at 300 °C.
